{"id":14,"date":"2010-07-09T18:48:23","date_gmt":"2010-07-09T18:48:23","guid":{"rendered":"https:\/\/www.brandonu.ca\/microscope\/micro-analytical-facilities\/scanning-electron-microscope\/"},"modified":"2021-11-18T10:37:31","modified_gmt":"2021-11-18T16:37:31","slug":"scanning-electron-microscope","status":"publish","type":"page","link":"https:\/\/www.brandonu.ca\/microscope\/equipment-and-applications\/scanning-electron-microscope\/","title":{"rendered":"Scanning Electron Microscope"},"content":{"rendered":"<h2>Scanning Electron Microscope and X-Ray Detector<\/h2>\n<p><img loading=\"lazy\" decoding=\"async\" alt=\"Upload3\" src=\"\/microscope\/files\/2010\/08\/Upload3.jpg\" height=\"142\" border=\"0\" width=\"184\" \/><br \/>\n<em> <strong> <a target=\"_self\" href=\"micro-analytical-facilities\/compositional-analysis\/\" rel=\"noopener\">INCA x-act X-Ray Detector<\/a> <\/strong> <\/em><\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload4\" src=\"\/microscope\/files\/2010\/08\/Upload4.jpg\" height=\"333\" border=\"0\" width=\"500\" \/>\n<p><em> <strong>SCANNING ELECTRON MICROSCOPE<\/strong> <\/em><\/p>\n<p>&nbsp;<\/p>\n<h2>JEOL JSM-6390LV\/LGS Scanning Electron Microscope<\/h2>\n<ul>\n<li>Magnification of the JEOL JSM-6390LV\/LGS is on the order of 300,000x magnification, where fine details of specimens can be observed<\/li>\n<li>The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm<\/li>\n<li>The customizable GUI interface allows the instrument to be intuitively operated, and Smile Shot<sup>TM<\/sup> software ensures optimum operation settings<\/li>\n<li>The JSM-6390 specimen chamber can accomodate up to 6-inches in diameter<\/li>\n<li style=\"list-style-image: none; list-style-type: none;\"><\/li>\n<li style=\"list-style-image: none; list-style-type: none;\"><img loading=\"lazy\" decoding=\"async\" alt=\"Upload5b\" src=\"\/microscope\/files\/2010\/08\/Upload5b.jpg\" height=\"231\" align=\"right\" border=\"0\" width=\"350\" \/><\/li>\n<li>Standard automated features include auto focus\/auto stignator, auto gun (saturation, bias, and allignment), and automatic contrast and brightness<\/li>\n<li>The JSM-6390 is used in many and varied applications<\/li>\n<\/ul>\n<p align=\"right\"><strong> <em> <a href=\"http:\/\/www.jeolusa.com\/PRODUCTS\/ElectronOptics\/ScanningElectronMicroscopesSEM\/HighVacuumLowVacuum\/JSM6390\/tabid\/187\/Default.aspx\" target=\"_self\" rel=\"noopener\">JEOL JSM-6390LV\/LGS SEM<\/a> <\/em> <\/strong><\/p>\n<p>&nbsp;<\/p>\n<h2>JEOL JSM-6390LV\/LGS Specifications<\/h2>\n<table summary=\"\" align=\"left\" border=\"1\" cellpadding=\"1\" cellspacing=\"1\" width=\"400\">\n<tbody>\n<tr>\n<td>Magnification<\/td>\n<td>5 to 300,000x<\/td>\n<\/tr>\n<tr>\n<td>kV<\/td>\n<td>0.5 to 30kV<\/td>\n<\/tr>\n<tr>\n<td>SEI @ 30kV<\/td>\n<td>3nm<\/td>\n<\/tr>\n<tr>\n<td>SEI @ 1kV<\/td>\n<td>15nm<\/td>\n<\/tr>\n<tr>\n<td>BEI @ 30kV<\/td>\n<td>4nm<\/td>\n<\/tr>\n<tr>\n<td>Stage X, Y, Z<\/td>\n<td>80mm x 40mm x 48mm<\/td>\n<\/tr>\n<tr>\n<td>EDS Geometry<\/td>\n<td>35\u00b0 TOA @ 10mm<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<h2>What is a Scanning Electron Microscope?<\/h2>\n<p>The SEM is a type of electron microscope that creates various images by focusing a high energy beam of electrons onto the surface of a sample and detecting signals from the interaction of the incident electrons with the sample&#8217;s surface.<\/p>\n<p>The primry function of the SEM is an <a target=\"_self\" href=\"micro-analytical-facilities\/imaging\/\" rel=\"noopener\"> <strong>IMAGING<\/strong> <\/a> platform that can image using secondary electrons (SE) or backscattered electrons (BSE).<\/p>\n<p>When coupled with X-ray detectors, we can determine <strong> <a href=\"micro-analytical-facilities\/compositional-analysis\/\" target=\"_self\" rel=\"noopener\">COMPOSITIONS<\/a> <\/strong> of materials.<\/p>\n<p>&nbsp;<\/p>\n<h2>Scanning Electron Microscope: Main Components<\/h2>\n<p><img loading=\"lazy\" decoding=\"async\" alt=\"components\" src=\"\/microscope\/files\/2010\/08\/components.gif\" height=\"326\" align=\"right\" border=\"0\" width=\"350\" \/><strong>Vacuum system<\/strong><\/p>\n<ul>\n<li>coherent electron beam<\/li>\n<\/ul>\n<p><strong>Electron Gun<\/strong><\/p>\n<ul>\n<li>Tungsten filament<\/li>\n<li>Accelerating voltage<\/li>\n<\/ul>\n<p><strong>Lens system<\/strong><\/p>\n<ul>\n<li>Electromagnetic lenses<\/li>\n<\/ul>\n<p><strong>Scan Unit<\/strong><\/p>\n<ul>\n<li>Imaging<\/li>\n<\/ul>\n<p><strong>Detector Units<\/strong><\/p>\n<ul>\n<li>BSE<\/li>\n<li>SE<\/li>\n<li>X-Ray (EDS\/WDS)<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<h2>Scanning Electron Microscope: Signals<\/h2>\n<p>Electrons react with specimen to produce different signals:<\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload7\" src=\"\/microscope\/files\/2010\/08\/Upload7.gif\" height=\"376\" border=\"0\" width=\"432\" \/>\n<p>&nbsp;<\/p>\n<ol>\n<li>Secondary Electrons (SE)<\/li>\n<li>Backscattered Electrons (BSE)<\/li>\n<li>Characteristic X-Rays (EDS\/WDS)<\/li>\n<\/ol>\n<h2>How Does a SEM Work?<\/h2>\n<a href=\"\/microscope\/files\/2010\/08\/SEMImageFormation2-whole.avi\" target=\"_self\" rel=\"noopener\"><img loading=\"lazy\" decoding=\"async\" alt=\"Upload8\" src=\"\/microscope\/files\/2010\/08\/Upload8.jpg\" height=\"401\" border=\"0\" width=\"301\" \/><\/a>\n<ul>\n<li>An electron gun generates an electron beam<\/li>\n<li>The electron beam is focused through a set of electromagnetic lenses<\/li>\n<li>Imaging occurs through the scan unit<\/li>\n<li>Various detectors acquire the various signals to display an image<\/li>\n<\/ul>\n<p>&nbsp;<\/p>\n<h2>Magnification<\/h2>\n<p>Magnification is a function of the raster area.<\/p>\n<p>MAGNIFICATION = Size of Raster on Viewing Screen\/Size of Raster on Specimen<\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload9\" src=\"\/microscope\/files\/2010\/08\/Upload9.jpg\" height=\"404\" border=\"0\" width=\"500\" \/>\n<p>&nbsp;<\/p>\n<h2>Sample Preparation<\/h2>\n<p>Various sample preparation methods and mounting methods are used for SEM imaging and analysis including adhesion of dry samples to metal stubs, epoxy-embedded grain mounts of particales, polished thin sections, biological samples, and even frozen samples requiring cooling stages.<\/p>\n<p><em> <strong>Stub Mounts<\/strong> <\/em><\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload10\" src=\"\/microscope\/files\/2010\/08\/Upload10.jpg\" height=\"150\" align=\"left\" border=\"0\" width=\"200\" \/>\n<p><strong> <em>Cryo Stub<\/em> <\/strong><\/p>\n<p><strong> <em> <img loading=\"lazy\" decoding=\"async\" alt=\"Upload13\" src=\"\/microscope\/files\/2010\/08\/Upload13.jpg\" height=\"73\" border=\"0\" width=\"94\" \/><\/em> <\/strong><\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<p><strong> <em>Thin Section<\/em> <\/strong><\/p>\n<p><strong> <em><\/em> <\/strong> <img loading=\"lazy\" decoding=\"async\" alt=\"Upload14\" src=\"\/microscope\/files\/2010\/08\/Upload14.jpg\" height=\"221\" align=\"left\" border=\"0\" width=\"150\" \/><\/p>\n<p><strong> <em> Grain Mount<\/em><\/strong><\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload11\" src=\"\/microscope\/files\/2010\/08\/Upload11.jpg\" height=\"251\" align=\"right\" border=\"0\" width=\"333\" \/>\n<p><strong> <em>Cryo Stage (Liquid Nitrogen Cooling Holder)<\/em> <\/strong><\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload12\" src=\"\/microscope\/files\/2010\/08\/Upload12.jpg\" height=\"232\" align=\"left\" border=\"0\" width=\"304\" \/>\n<h2>Sample Holders<\/h2>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload15\" src=\"\/microscope\/files\/2010\/08\/Upload15.jpg\" height=\"304\" border=\"0\" width=\"500\" \/>\n<h2>Conductive Coating<\/h2>\n<p>This Facility houses a Denton Vacuum Desk IV Sputter Coater and carbon coating accessories.<\/p>\n<img loading=\"lazy\" decoding=\"async\" alt=\"Upload37\" src=\"\/microscope\/files\/2010\/08\/Upload37.jpg\" height=\"250\" border=\"0\" width=\"313\" \/>\n","protected":false},"excerpt":{"rendered":"<p>Scanning Electron Microscope and X-Ray Detector INCA x-act X-Ray Detector SCANNING ELECTRON MICROSCOPE &nbsp; JEOL JSM-6390LV\/LGS Scanning Electron Microscope Magnification of the JEOL JSM-6390LV\/LGS is on the order of 300,000x magnification, where fine details of specimens can be observed The JSM-6390 is a high-performance, low cost, scanning electron microscope with a high resolution of 3.0nm [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":6,"menu_order":0,"comment_status":"open","ping_status":"open","template":"","meta":{"footnotes":""},"class_list":["post-14","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/pages\/14","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/comments?post=14"}],"version-history":[{"count":5,"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/pages\/14\/revisions"}],"predecessor-version":[{"id":174,"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/pages\/14\/revisions\/174"}],"up":[{"embeddable":true,"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/pages\/6"}],"wp:attachment":[{"href":"https:\/\/www.brandonu.ca\/microscope\/wp-json\/wp\/v2\/media?parent=14"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}